{"title":"Bandpass Filters for Subsurface Inspection","description":"\u003cp data-path-to-node=\"1\"\u003eBandpass filters for subsurface inspection are designed to transmit selected near-infrared (NIR) and short-wave infrared (SWIR) bands while reducing unwanted out-of-band light and surface reflections. Because these specific wavelengths can penetrate materials that are opaque to visible light—such as silicon, certain plastics, and biological tissues—these filters enable optical sensors to capture internal structures, layers, and hidden defects.\u003c\/p\u003e\n\u003cp data-path-to-node=\"2\"\u003e\u003cb data-path-to-node=\"2\" data-index-in-node=\"0\"\u003eApplications:\u003c\/b\u003e\u003c\/p\u003e\n\u003cul data-path-to-node=\"3\"\u003e\n\u003cli\u003eSemiconductor inspection for isolating SWIR wavelengths to detect internal cracks, alignment marks, and structural defects within silicon wafers\u003c\/li\u003e\n\u003cli\u003eMedical and biological imaging, such as Optical Coherence Tomography (OCT), for deep tissue penetration and subsurface structural analysis\u003c\/li\u003e\n\u003cli\u003eIndustrial non-destructive testing (NDT) for inspecting the internal integrity of plastics, composites, and opaque packaging materials\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp data-path-to-node=\"4\"\u003e \u003c\/p\u003e","products":[{"product_id":"bp1300-10","title":"BP1300-10 Bandpass Filter(CWL=1300nm,FWHM=10nm)","description":"\u003cul\u003e\n\u003cli\u003e\n\u003cstrong\u003eWavelength:\u003c\/strong\u003e 1300nm center wavelength (CWL) for SWIR subsurface inspection and silicon wafer analysis\u003c\/li\u003e\n\u003cli\u003e\n\u003cstrong\u003eSpectral Features:\u003c\/strong\u003e 10nm FWHM bandwidth with high transmission and controlled edge slopes\u003c\/li\u003e\n\u003cli\u003e\n\u003cstrong\u003eOptical Density:\u003c\/strong\u003e OD4 blocking for reliable out-of-band rejection\u003c\/li\u003e\n\u003cli\u003e\n\u003cstrong\u003eFilter Dimension Availability:\u003c\/strong\u003e Multiple mounting diameters available to fit standard optical systems\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"SyronOptics","offers":[{"title":"CWL=1300nm \/\/ FWHM=10nm \/ OD5@200-1400nm \/\/ T＞90% \/ dia12.5mm(unmounted)","offer_id":50405333762331,"sku":"SO3010043-d12.5u","price":120.0,"currency_code":"USD","in_stock":true},{"title":"CWL=1300nm \/\/ FWHM=10nm \/ OD5@200-1400nm \/\/ T＞90% \/ dia12.5mm(mounted)","offer_id":51219851411739,"sku":"SO3010043-d12.5mt","price":125.0,"currency_code":"USD","in_stock":true},{"title":"CWL=1300nm \/\/ FWHM=10nm \/ OD5@200-1400nm \/\/ T＞90% \/ dia25mm(unmounted)","offer_id":51219851444507,"sku":"SO3010043-d25u","price":150.0,"currency_code":"USD","in_stock":true},{"title":"CWL=1300nm \/\/ FWHM=10nm \/ OD5@200-1400nm \/\/ T＞90% \/ dia25mm(mounted)","offer_id":51219851477275,"sku":"SO3010043-d25mt","price":155.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0759\/8755\/0491\/files\/BP1310-12.webp?v=1753545269"}],"url":"https:\/\/syronoptics.com\/collections\/optical-filters-used-in-subsurface-inspection.oembed","provider":"SyronOptics","version":"1.0","type":"link"}