The Deterioration Mechanisms of the Synergistic Radiation of Proton and Electrons on Bandpass Filter

The Deterioration Mechanisms of the Synergistic Radiation of Proton and Electrons on Bandpass Filter

Citation

张剑锋 (ZHANG Jian-feng), 郭 云 (GUO Yun), & 杨生胜 (YANG Sheng-sheng). (2016年8月). 电子/质子综合辐照带通滤光片的性能退化机理研究 [The Deterioration Mechanisms of the Synergistic Radiation of Proton and Electrons on Bandpass Filter]. 真空与低温 [Vacuum & Cryogenics], 22(4), 210-213. doi: 10.3969/j.issn.1006-7086.2016.04.006.

Keywords

  • 带通滤光片 / Bandpass Filter
  • 电子/质子辐照 / Electron/Proton Irradiation
  • 性能退化 / Performance Degradation
  • 空间飞行 / Space Flight
  • 光学薄膜 / Optical Film
  • 低地球轨道 / Low Earth Orbit
  • 总注量 / Total Fluence
  • 透过率 / Transmittance
  • 中心波长 / Center Wavelength
  • 单晶Ge / Single Crystal Ge
  • XPS / X-ray Photoelectron Spectroscopy
  • AFM / Atomic Force Microscopy
  • 微观分析 / Microscopic Analysis
  • 表面粗糙度 / Surface Roughness
  • 折射率 / Refractive Index

Brief

This article investigates the performance degradation of bandpass filters with ZnS and PbTe film layers under combined electron and proton irradiation, simulating a low Earth orbit environment of 8 years, and reveals that the irradiation leads to decreased transmittance and a shift in the central wavelength due to damage to the film layers and surface changes.

Summary

This article examines the effects of combined electron and proton irradiation on bandpass filters made of ZnS and PbTe thin films, simulating an 8-year low Earth orbit exposure. The study found that this irradiation caused a decrease in the peak transmittance and a shift of the center wavelength towards longer wavelengths. Surface analysis using XPS revealed the breaking of Zn-S bonds and the formation of oxides (PbO2, PbO, TeO2) on the PbTe layer, likely due to the partial peeling of the ZnS top layer and subsequent oxidation of the exposed PbTe in air. AFM analysis showed an increase in surface roughness after irradiation. The researchers concluded that the combined electron and proton irradiation leads to performance degradation of the bandpass filters and suggest optimizing the film design and manufacturing process to enhance their radiation resistance for space applications.

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