Bandpass Filters for Subsurface Inspection

Bandpass filters for subsurface inspection are designed to transmit selected near-infrared (NIR) and short-wave infrared (SWIR) bands while reducing unwanted out-of-band light and surface reflections. Because these specific wavelengths can penetrate materials that are opaque to visible light—such as silicon, certain plastics, and biological tissues—these filters enable optical sensors to capture internal structures, layers, and hidden defects.

Applications:

  • Semiconductor inspection for isolating SWIR wavelengths to detect internal cracks, alignment marks, and structural defects within silicon wafers
  • Medical and biological imaging, such as Optical Coherence Tomography (OCT), for deep tissue penetration and subsurface structural analysis
  • Industrial non-destructive testing (NDT) for inspecting the internal integrity of plastics, composites, and opaque packaging materials

 
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  • BP1300-10 Bandpass Filter(CWL=1300nm,FWHM=10nm)

    OD5@200-1400nm

    $120.00
    $120.00

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